Trip out time (RCD t) and Trip out current (RCD I) measurements.
Item: RCD Tester
Model: METREL MI 3100 s
Reference Laboratory: ISO IEC 17025 accreditated laboratory or NMI
Measurement points:
Trip Out time
UUT | Measurement points |
---|---|
RCD t 10 mA X1 – AC – 0°- general non delayed | 300 ms |
RCD t 30 mA X1 – AC – 0°- general non delayed | 150 ms, 300 ms |
RCD t 300 mA X1 – AC – 0°- general non delayed | 150 ms, 300 ms |
RCD t 30 mA X1 – AC – 180°- general non delayed | 300 ms |
RCD t 30 mA X1 – AC – 0°- Selective | 390 ms |
RCD t 30 mA X2 – AC – 0°- general non delayed | 150 ms |
RCD t 30 mA X5 – AC – 0°- general non delayed | 40 ms |
RCD t 500 mA X5 – AC – 0°- general non delayed | 20 ms |
Trip Out current
20 ms (Trip out time reference)
UUT | Measurement points |
---|---|
RCD I 10 mA – AC – 0° – general non delayed | 10 mA |
RCD I 30 mA – AC – 0° – general non delayed | 30 mA |
RCD I 1000 mA – AC – 0° – general non delayed | 1000 mA |
RCD I 30 mA – AC – 180° – general non delayed | 30 mA |
Reference Laboratory CMC:
RCD trip Time 10 – 5000 ms |
0.020% +0.25 ms |
RCD trip Current 3 mA – 3000 mA |
1% |
Note: Indications regarding organizational methods, presentation and sending of results will be reported in the PT participation protocol
Scheduled start date for PT: September 2023
Payment: by bank transfer